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FinFET SRAM: Optimizing Silicon Fin Thickness and Fin Ratio to Improve Stability at iso Area.

Dheepa LekshmananAditya BansalKaushik Roy
Published in: CICC (2007)
Keyphrases
  • low cost
  • high speed
  • stability analysis
  • data sets
  • machine learning
  • artificial intelligence
  • heat transfer