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In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I).
Florence Sagnard
Faroudja Bentabet
Christophe Vignat
Published in:
IEEE Trans. Instrum. Meas. (2005)
Keyphrases
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neural network
theoretical basis
frequency band
high level
theoretical framework
table of contents
real time
higher level
computational model
theoretical foundation
measured data
materials science