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A fast analog circuit yield estimation method for medium and high dimensional problems.
Bo Liu
Jarir Messaoudi
Georges G. E. Gielen
Published in:
DATE (2012)
Keyphrases
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preprocessing
high dimensional problems
dimension reduction
similarity measure
low cost
data sets
feature selection
knowledge base
active learning
probabilistic model
high speed
unsupervised learning
sample set
wavelet packet transform