A Non-Invasive Characterization Method for MEMS Based Devices.
Abbas PanahiEbrahim Ghafar-ZadehSebastian MagierowskiMohammad Hossein SabourPublished in: MWSCAS (2018)
Keyphrases
- computational cost
- high accuracy
- preprocessing
- error rate
- experimental evaluation
- detection method
- fully automatic
- pairwise
- mathematical model
- probabilistic model
- clustering algorithm
- segmentation method
- feature set
- high precision
- classification method
- experimental study
- support vector machine svm
- em algorithm
- medical images
- cost function
- significant improvement
- support vector
- similarity measure