Sample-Optimal Identity Testing with High Probability.

Ilias Diakonikolas Themis Gouleakis John Peebles Eric Price

Published in: Electron. Colloquium Comput. Complex. (2017)

Keyphrases

wide range
random sample
probability distribution
high precision
data sets
optimal solution
dynamic programming
optimal design
neural network
sample size
random sampling
small sample
slightly higher