Guaranteeing Testability in Re-encoding for Low Power.

Silvia Chiusano Fulvio Corno Paolo Prinetto Maurizio Rebaudengo Matteo Sonza Reorda

Published in: Asian Test Symposium (1997)

Keyphrases

low power
power consumption
low cost
high speed
single chip
high power
low power consumption
wireless transmission
image sensor
cmos technology
vlsi architecture
gate array
digital signal processing
low density parity check
real time
power reduction