Login / Signup

Temperature and process-aware performance monitoring and compensation for an ULP multi-core cluster in 28nm UTBB FD-SOI technology.

Alfio Di MauroDavide RossiAntonio PulliniPhilippe FlatresseLuca Benini
Published in: PATMOS (2017)
Keyphrases
  • data sets
  • silicon on insulator
  • information systems
  • data processing
  • monitoring system
  • case study
  • data points
  • computer systems
  • development process
  • diffusion process
  • early warning