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Deep Learning-Based Binocular Image Analysis for In Situ Measurement of Particle Length Distribution During Crystallization Process.

Ji FanTao LiuYongcan ShuangBo SongJunghui ChenYonghong Tan
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • deep learning
  • image analysis
  • computer vision
  • higher order
  • unsupervised feature learning
  • image processing
  • image segmentation
  • feature extraction
  • pattern recognition
  • decision process