Repeater insertion in deep sub-micron CMOS: ramp-based analytical model and placement sensitivity analysis.

Ankireddy Nalamalpu Wayne P. Burleson

Published in: ISCAS (2000)

Keyphrases

sensitivity analysis
analytical model
micron cmos
influence diagrams
analytical models
simulation model
managerial insights
variational inequalities
bit error rate
wastewater treatment
viewpoint
evolutionary algorithm
multi objective