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Intra-Gate Length Biasing for Leakage Optimization in 45 nm Technology Node.
Yesung Kang
Youngmin Kim
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2013)
Keyphrases
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nm technology
power consumption
low power
optimization problems
optimization algorithm
high speed
optimization method
path length
computer vision
global optimization
optimization process
nano scale
low cost
graph structure