A non-intrusive method for measuring switching losses of GaN power transistors.
Julio BrandeleroBernardo CougoThierry MeynardNicolas VideauPublished in: IECON (2013)
Keyphrases
- preprocessing
- computational cost
- high accuracy
- prior knowledge
- experimental evaluation
- feature set
- detection method
- support vector machine svm
- computationally efficient
- image processing
- significant improvement
- pairwise
- cost function
- theoretical analysis
- synthetic data
- segmentation method
- fully automatic
- linear regression