Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures.
Chang-Feng YangChun-Yu WuMeng-Chun ShihMing-Ta YangMing-Han YangYu-Tien WuTa-Chun ChienChih-Wei LaiShih-Chi TsaiWen-Ting ChuArthur HungPublished in: VLSI Technology and Circuits (2022)
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