A SVM Based Method to Detect Color Shift Defects in IC Packages.

R. M. C. B. Ratnayake Craig Hicks M. A. Akbari

Published in: MVA (2007)

Keyphrases

detection method
high precision
synthetic data
support vector machine
color correction
support vector machine svm
experimental evaluation
computational complexity
computational cost
significant improvement
classification accuracy
image processing
high accuracy
detection algorithm
k means
color space
multiscale