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Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters.
Simone Negri
Giordano Spadacini
Flavia Grassi
Sergio Amedeo Pignari
Published in:
IEEE Trans. Ind. Electron. (2024)
Keyphrases
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maximum likelihood
parameter estimation
data sets
input parameters
multiscale
database
artificial intelligence
parameter settings
parameter values
expectation maximization
analog circuits
maximum likelihood estimation
high speed
image segmentation
knowledge base
information systems
social networks
data mining