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A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise.
Mohammad Oveisi
Payam Heydari
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
Keyphrases
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image sequences
error rate
empirical studies
end to end
signal to noise ratio
noise level
image noise