Stacked convolutional sparse denoising auto-encoder for identification of defect patterns in semiconductor wafer map.
Jianbo YuXiaoyun ZhengJiatong LiuPublished in: Comput. Ind. (2019)
Keyphrases
- denoising
- semiconductor manufacturing
- basis pursuit
- noisy images
- sparse coding
- image denoising
- pattern mining
- bit rate
- natural images
- motion estimation
- wavelet domain
- sparse representation
- rate distortion
- sparse data
- maximum a posteriori
- data mining techniques
- pattern discovery
- decoding process
- computer vision
- compressive sensing
- denoising methods
- feature vectors
- image processing