Login / Signup
Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology.
Animesh Datta
Saibal Mukhopadhyay
Swarup Bhunia
Kaushik Roy
Published in:
IOLTS (2005)
Keyphrases
</>
power dissipation
nm technology
power consumption
low power
high speed
prediction accuracy
prediction model
prediction error
prediction algorithm
neural network
low cost
digital signal processing
case study
analog circuits
data flow
design methodology
circuit design
root cause
computer vision