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Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations.

Diane-Perle SadikJuan ColmenaresJang-Kwon LimMietek BakowskiHans-Peter Nee
Published in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
  • short circuit
  • power consumption
  • integrated circuit
  • neural network
  • genetic algorithm
  • hidden markov models