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Relation between internal terminal voltage and immunity behavior of LDO regulator circuits.

Hidetoshi MiyaharaNobuaki IkeharaTohlu MatsushimaTakashi HisakadoOsami Wada
Published in: EMC Compo (2015)
Keyphrases
  • steady state
  • low voltage
  • high speed
  • behavior patterns
  • reinforcement learning
  • evolutionary algorithm
  • field effect transistors