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Deep Bayesian Slow Feature Extraction With Application to Industrial Inferential Modeling.
Chao Jiang
Yusheng Lu
Weimin Zhong
Biao Huang
Dayu Tan
Wenjiang Song
Feng Qian
Published in:
IEEE Trans. Ind. Informatics (2023)
Keyphrases
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feature extraction
application of data mining
image processing
face recognition
pattern recognition
data sets
feature selection
multiresolution
hidden markov models
image classification
maximum likelihood
decision support
support vector machine svm
texture analysis
extracted features
model driven