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Comparison of temperature models for the drain current of MESFET's.

Joe Rodriguez-TellezB. P. StothardC. Galvan
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • probabilistic model
  • expert systems
  • statistical models
  • data sets
  • image sequences
  • prior knowledge
  • model selection
  • machine learning algorithms
  • prediction model
  • classification models
  • modeling framework