Influence of charged samples on imaging in scanning ion conductance microscopy.
Kimihiro IshizakiTatsuo UshikiMasato NakajimaFutoshi IwataPublished in: MHS (2013)
Keyphrases
- image analysis
- high resolution
- fluorescence microscopy
- image processing
- data sets
- high throughput
- medical imaging
- factors influencing
- single shot
- training samples
- data acquisition
- scan data
- training set
- structured light
- imaging systems
- phase contrast images
- imaging technology
- image stacks
- high energy
- imaging devices
- sample points
- magnetic resonance images
- image enhancement
- pattern recognition
- feature selection
- computer vision
- neural network