Measuring Time Base Distortion in Analog-Memory Sampling Digitizers.
Filippo AttivissimoAttilio Di NisioNicola GiaquintoMario SavinoPublished in: IEEE Trans. Instrum. Meas. (2008)
Keyphrases
- memory usage
- random sampling
- low memory
- memory requirements
- analog vlsi
- sample size
- main memory
- multiscale
- sampling methods
- sampled data
- sampling algorithm
- sampling strategy
- parameter space
- computing power
- memory size
- computational complexity
- memory space
- circuit design
- frequency modulation
- random access
- computational power
- database management systems
- signal processing
- low cost
- data streams