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Metrological Characterization and Comparison of D415, D455, L515 RealSense Devices in the Close Range.

Michaela ServiElisa MussiAndrea ProfiliRocco FurferiYary VolpeLapo GoverniFrancesco Buonamici
Published in: Sensors (2021)
Keyphrases
  • wide range
  • data mining
  • mobile devices
  • hidden markov models
  • image registration
  • machine learning
  • learning algorithm
  • multiresolution
  • statistical analysis