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The impact of Miller and coupling effects on single event transient in logical circuits.

Baojun LiuLi CaiXiaokuo YangHongtu HuangPeng BaiWeidong Peng
Published in: Microelectron. J. (2012)
Keyphrases
  • negative effects
  • high speed
  • event detection
  • negative impact
  • database
  • neural network
  • learning algorithm
  • spatio temporal
  • positive effects
  • interaction effects
  • logical representation
  • analog vlsi