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Discussion and analysis of Au/a-Si contact resistance in MEMS/NEMS devices.

Fengshan FuFang YangWei WangXian HuangJun HeLi ZhangTaotao GuanRui LiDacheng Zhang
Published in: NEMS (2015)
Keyphrases
  • real time
  • statistical analysis
  • quantitative analysis
  • database
  • neural network
  • information systems
  • case study
  • learning environment
  • evolutionary algorithm