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Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests.

Bin LiuYimin ShiFode ZhangXuchao Bai
Published in: J. Comput. Appl. Math. (2017)
Keyphrases
  • bayesian estimation
  • data sets
  • probability distribution
  • missing data
  • training data
  • statistical methods
  • high quality
  • data analysis
  • statistical analysis
  • missing values
  • data points
  • co occurrence
  • incomplete data