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Total ionizing dose effects on analog performance of 28 nm bulk MOSFETs.

C.-M. ZhangFarzan JazaeriAlessandro PezzottaClaudio BruschiniGiulio BorghelloS. MattiazzoAndrea BaschirottoChristian C. Enz
Published in: ESSDERC (2017)
Keyphrases
  • real time
  • data sets
  • databases
  • artificial intelligence
  • data mining
  • signal processing
  • vlsi implementation
  • vlsi architecture
  • analog vlsi