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Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates.

Walid IbrahimValeriu BeiuAzam Beg
Published in: IEEE Trans. Reliab. (2012)
Keyphrases
  • metal oxide semiconductor
  • low cost
  • integrated circuit
  • image sensor
  • hardware and software
  • real time
  • signal processing
  • digital camera