Coverage method for FPGA fault logic blocks by spares.
Vladimir HahanovEugenia LitvinovaWajeb GharibiOlesya GuzPublished in: EWDTS (2010)
Keyphrases
- high accuracy
- experimental evaluation
- high speed
- high precision
- data sets
- segmentation method
- detection method
- probabilistic model
- significant improvement
- pairwise
- objective function
- neural network
- prior knowledge
- computational cost
- feature space
- preprocessing
- clustering method
- image processing
- synthetic data
- feature selection