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Overall Uncertainty Estimation in Multiple Narrow-Band In Situ Electromagnetic Field Measurements.

Dimitrios I. StratakisAndreas MiaoudakisThomas D. XenosVassilios Zacharopoulos
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • electromagnetic field
  • narrow band
  • electromagnetic fields
  • level set
  • level set method
  • computer vision
  • experimental data
  • finite element method