At-speed I/O Test for Fast Vref Optimization in High Speed Single-ended Memory Systems.
Sanku MukherjeeSrinivasaraman ChandrasekaranGanapathy Subramanyan E. K.Arul SendhilPublished in: VLSI Design (2013)
Keyphrases
- high speed
- real time
- low power
- memory size
- input output
- genetic algorithm
- distributed systems
- learning systems
- optimization process
- direct memory access
- database
- storage systems
- external memory
- optimization method
- optimization algorithm
- optimization problems
- response time
- management system
- evolutionary algorithm
- expert systems