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SPICE models for flicker noise in n-MOSFETs from subthreshold tostrong inversion.

Dingming XieMengzhang ChengLeonard Forbes
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
  • statistical models
  • random noise
  • low voltage
  • prior knowledge
  • probabilistic model
  • model selection
  • image reconstruction
  • genetic algorithm
  • machine learning algorithms
  • missing data
  • computational models