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SPICE models for flicker noise in n-MOSFETs from subthreshold tostrong inversion.
Dingming Xie
Mengzhang Cheng
Leonard Forbes
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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statistical models
random noise
low voltage
prior knowledge
probabilistic model
model selection
image reconstruction
genetic algorithm
machine learning algorithms
missing data
computational models