Photomask Defect Extraction by Using Difference between a Reference Image and a Test Image after Illumination Adjustment.

Youngmin Ha Hong Jeong

Published in: IPC (2007)

Keyphrases

test images
natural images
ground truth
image patches
transformed images
low resolution
face images
training stage
object categories
image regions
bounding box
image blocks
high resolution
higher order
training set
sparse representation
data analysis
object recognition
image processing
image analysis
high dimensional