Measuring time-dependent deformations in metallic MEMS.

L. I. J. C. Bergers J. P. M. Hoefnagels N. K. R. Delhey Marc G. D. Geers

Published in: Microelectron. Reliab. (2011)

Keyphrases

three dimensional
travel time
databases
database
image registration
image processing
web services
artificial neural networks
evolutionary algorithm