The Extreme Value Machine.

Ethan M. Rudd Lalit P. Jain Walter J. Scheirer Terrance E. Boult

Published in: IEEE Trans. Pattern Anal. Mach. Intell. (2018)

Keyphrases

extreme values
batch processing
high level
pattern recognition
supply chain
lead time
neural network
feature selection
multiscale
multi agent
cooperative
image retrieval
probabilistic model
flowshop