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Automatic Offset Correction for Measurements in the Nanovolt Range.

Graziella ScandurraGianluca CannatàCarmine Ciofi
Published in: IEEE Trans. Instrum. Meas. (2013)
Keyphrases
  • wide range
  • fully automatic
  • information retrieval
  • time of flight
  • real time
  • data sets
  • sensor measurements