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Threshold ion parameters of line-type soft-errors in biased thin-BOX SOI SRAMs: Difference between sensitivities to terrestrial and space radiation.
C. Chung
D. Kobayashi
K. Hirose
Published in:
IRPS (2018)
Keyphrases
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parameter space
sensitivity analysis
parameter estimation
jacobian matrix
threshold values
parameter settings
space time
search space
expectation maximization
x ray
data sets
infrared
higher dimensional
camera calibration
maximum likelihood
high quality
genetic algorithm
neural network