Automatic Detection of Region-Mura Defect in TFT-LCD.

Jae Yeong Lee Suk In Yoo

Published in: IEICE Trans. Inf. Syst. (2004)

Keyphrases

automatic detection
liquid crystal displays
tft lcd
thin film transistor
goal programming
high resolution
motion blur
image formation
stock price
eye tracking
supply chain
input image
thin film
higher resolution
post processing