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Special issue CogKnow.

Lledó Museros CabedoOriol PujolNúria Agell
Published in: Pattern Recognit. Lett. (2015)
Keyphrases
  • special issue
  • ai edam
  • ecml pkdd
  • international journal
  • applied intelligence
  • neural network
  • real world
  • knowledge base
  • knowledge management
  • intelligent systems
  • information processing
  • recent advances
  • special section