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Effect of Frequency on Reliability Of High-K MIM Capacitors.

X. FederspielA. GriffonM. BarlasP. Lamontagne
Published in: IRPS (2023)
Keyphrases
  • high cost
  • high reliability
  • high precision
  • negative impact
  • data sets
  • data mining
  • machine learning
  • search engine
  • computational complexity
  • evolutionary algorithm