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An empirical comparison among quality measures for pattern based classifiers.
Octavio Loyola-González
Milton García-Borroto
José Francisco Martínez Trinidad
Jesús Ariel Carrasco-Ochoa
Published in:
Intell. Data Anal. (2014)
Keyphrases
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quality measures
decision trees
training data
naive bayes
support vector
feature selection
class labels
training set
svm classifier
classification algorithm
quality metrics
image processing
training samples
machine learning algorithms
image quality assessment
structural similarity index