Modeling and Performance Comparison of GaN HEMT and SiC MOSFET for Onboard Charging Application.

Webster AdepojuIndranil BhattacharyaMuhammad E. BimaTrapa Banik
Published in: VTC Spring (2021)
Keyphrases
  • modeling method
  • data mining
  • image processing
  • clustering algorithm
  • case study
  • database systems
  • wide range
  • probabilistic model
  • model driven