Wafer Map Defect Recognition Based on Deep Transfer Learning.
Zongli ShenJianbo YuPublished in: IEEM (2019)
Keyphrases
- transfer learning
- learning tasks
- knowledge transfer
- cross domain
- reinforcement learning
- active learning
- structure learning
- labeled data
- domain adaptation
- machine learning algorithms
- machine learning
- transfer knowledge
- object recognition
- text classification
- learning algorithm
- text categorization
- algorithmic information theory
- target domain
- manifold alignment
- semi supervised learning
- multi task
- multi task learning
- neural network
- databases
- data sets
- collaborative filtering
- feature extraction