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Deep learning contour-based method for semi-automatic annotation of manufactured objects in electron microscopy images.

Isaac Wilfried SanouJulien BaderotStéphanie BricqYannick BenezethFranck MarzaniSergio MartinezJohann Foucher
Published in: J. Electronic Imaging (2024)
Keyphrases
  • automatic annotation
  • similarity measure
  • higher order
  • deep learning
  • machine learning
  • image data
  • pairwise
  • natural language processing
  • test images
  • microscopy images