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LAEPS: LDPC LLR Adaptive Estimation Based on Pattern Set Distribution Variation in 3D Charge Trap NAND Flash Memories.

Qianhui LiYiyang JiangQi WangLiu YangZexia WangXiaolei YuJing HeZongliang Huo
Published in: ICTA (2021)
Keyphrases
  • pattern set
  • probability distribution
  • turbo codes
  • data sets
  • data mining
  • feature points
  • associative memory
  • error correction
  • ldpc codes