Deconvolution algorithm dependencies of estimation errors of RTN effects on subnano-scaled SRAM margin variation.
Hiroyuki YamauchiWorawit SomhaPublished in: VLSI-SoC (2014)
Keyphrases
- estimation accuracy
- dynamic programming
- learning algorithm
- objective function
- estimation error
- optimization algorithm
- probabilistic model
- worst case
- computational complexity
- optimal solution
- k means
- detection algorithm
- synthetic and real images
- dependency analysis
- np hard
- machine learning
- ant colony optimization
- decision trees
- fir filters