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Design of a high performance CNFET 10T SRAM cell at 5nm technology node.

Zihao YangMinghui YinYunxia YouZhiqiang LiXin LiuWeihua Zhang
Published in: IEICE Electron. Express (2023)
Keyphrases
  • nm technology
  • power consumption
  • design process
  • low power
  • case study
  • pattern recognition
  • image analysis
  • fuzzy logic
  • signal processing
  • pattern matching
  • embedded systems