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Coupled measurement-simulation procedure for very high power fast recovery - Soft behavior diode design and testing.

Fulvio BertoluzzaPaolo CovaNicola DelmontePietro PampiliMarco Portesine
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • high power
  • neural network
  • low power
  • wavelet coefficients