Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network.
Hiroaki KudoTetsuya MatsumotoKentaro KutsukakeNoritaka UsamiPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2021)